6MFX

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.1 295 26% PEG4000, 0.1 M Tris-HCl, pH 8.1
Unit Cell:
a: 67.449 Å b: 73.987 Å c: 77.076 Å α: 94.310° β: 114.860° γ: 92.230°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.55 Solvent Content: 51.73
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.2000 69.5800 66842 1973 97.9100 0.1963 0.2440 54.0860
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 69.58 98.00 ? ? 9.1 3.3 ? 66903 ? ? 34.64
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.25 96.7 ? ? 1.6 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.979 CLSI 08ID-1
Software
Software Name Purpose Version
PHENIX refinement dev_3584
DIALS data reduction .
DIALS data scaling .
PHASER phasing .