6MBC

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 295 1.8 - 2.0 M NH4SO4, 50 mM MES pH 6.5
Unit Cell:
a: 43.466 Å b: 42.905 Å c: 46.666 Å α: 90.000° β: 114.210° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 37.22
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 1.7520 42.5630 15074 1501 94.6000 0.1860 0.2121 47.2446
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.750 50.000 94.800 0.068 ? 7.100 4.100 ? 15078 ? ? 26.300
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.750 1.780 70.700 ? ? ? 1.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97910 APS 24-ID-C
Software
Software Name Purpose Version
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX refinement 1.13_2998
PDB_EXTRACT data extraction 3.24
PHENIX phasing .