X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 100mM MES, pH5.8, 10% PEG6000, 3% DMSO, 1mM DTT
Unit Cell:
a: 114.868 Å b: 53.600 Å c: 44.705 Å α: 90.000° β: 101.250° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.00 Solvent Content: 38.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.7000 38.4230 29169 1446 98.9700 0.1770 0.2040 32.9822
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.700 50.000 99.000 0.077 ? 4.000 6.700 ? 29174 ? ? 24.330
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.700 1.760 98.300 ? ? ? 6.700 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL18U1 0.9793 SSRF BL18U1
Software
Software Name Purpose Version
PHENIX refinement 1.17.1
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing 2.5.6
PDB_EXTRACT data extraction 3.25
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