X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 293 0.2 M potassium bromide, 0.2 M potassium thiocyanate, 0.1 M sodium acetate, 3% w/v PGA-LM (Polyglycolic acid, 200-400 kDa) and 3% w/v PEG (Polyethylene glycol, 20 kDa), pH 5
Unit Cell:
a: 63.460 Å b: 63.460 Å c: 63.460 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 3 2
Crystal Properties:
Matthew's Coefficient: 1.89 Solvent Content: 35.01
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.3000 36.6390 2214 349 100.0000 0.1915 0.2331 35.2329
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 36.640 100.000 0.131 0.131 16.600 14.000 ? 2214 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.300 2.420 100.000 ? 0.035 ? 14.500 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 ? ?
Software
Software Name Purpose Version
SCALA data scaling 3.3.21
PHENIX refinement 1.9
PDB_EXTRACT data extraction 3.24
MOSFLM data reduction .
PHASER phasing .
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