6LQN

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277.15 0.09 M NPS (0.03 M NaNO3, 0.03 M Na2HPO4, 0.03 M (NH4)2SO4); 0.1 M MES/imidazole pH 6.5; 37.5% precipitants (12.5% PEG1000,12.5% PEG 3350,12.5% MPD)
Unit Cell:
a: 73.320 Å b: 61.570 Å c: 58.110 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.30
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD NONE 1.60002201523 36.66 66689 3772 99.4141498465 0.166858938464 0.188803534941 24.9450353465
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 47.15 99.2 ? ? 13.39 3.41 ? 66862 ? ? 15.3432910578
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.6 1.69 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97915 SSRF BL17U
Software
Software Name Purpose Version
PHENIX refinement 1.10.1_2155
REFMAC refinement CCP4-7.0
XDS data reduction .
XSCALE data scaling .
PHASER phasing .