X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 277.15 K | ? |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | SSRF BEAMLINE BL18U1 | 0.97778 | SSRF | BL18U1 |
| Software Name | Purpose | Version |
|---|---|---|
| REFMAC | refinement | 5.8.0232 |
| HKL-2000 | data collection | . |
| HKL-2000 | data reduction | . |
| HKL-2000 | data scaling | . |
| Coot | model building | . |
| SHELXCD | phasing | . |
