X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 1.2 M Ammonium Chloride, 0.1 M Sodium Acetate, pH 4.6
Unit Cell:
a: 55.424 Å b: 55.484 Å c: 79.158 Å α: 100.509° β: 105.662° γ: 97.988°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.23 Solvent Content: 44.76
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.10 37.40 47853 2430 93.94 0.2056 0.2540 28.69
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 50 96.7 0.111 ? 10.34 3.3 ? 49082 ? ? 26.46
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.18 ? ? 0.379 3.36 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE MASSIF-3 0.988 ESRF MASSIF-3
Software
Software Name Purpose Version
PHENIX refinement 1.13_2998
HKL-3000 data reduction .
HKL-3000 data scaling .
MOLREP phasing .
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