6L5Z

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 20% (w/v)PEG 3350,0.2M Ammonium Nitrate
Unit Cell:
a: 106.240 Å b: 106.240 Å c: 45.492 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 4.21 Solvent Content: 70.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.0500 40.7800 5803 620 99.8100 0.1937 0.2218 77.0601
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.050 50.000 99.800 0.098 ? 6.400 9.700 ? 5816 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.050 3.100 100.000 ? ? ? 9.600 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9791 SSRF BL17U
Software
Software Name Purpose Version
PHENIX refinement 1.17.1_3660
HKL-2000 data scaling .
PDB_EXTRACT data extraction 3.25
HKL-2000 data reduction .
MOLREP phasing .