ELECTRON MICROSCOPY

Sample

Type V pilus (FimA)

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE-PROPANE
Sample Vitrification Details 3 second blot, 3.0uL
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 61728
Reported Resolution (Å) 3.6
Resolution Method FSC 0.143 CUT-OFF
Other Details independent
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target CC
Overall B Value 128
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type FEI FALCON III (4k x 4k)
Electron Dose (electrons/Å2) 46
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TALOS ARCTICA
Minimum Defocus (nm) -1500
Maximum Defocus (nm) -2500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 92000
Calibrated Magnification 125000
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details nanoprobe, parallel beam illumination
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION EPU 2.1.0
CTF CORRECTION CTFFIND 4.1
MODEL FITTING Coot 0.8.9
INITIAL EULER ASSIGNMENT cisTEM 1.0.1-beta
FINAL EULER ASSIGNMENT cisTEM 1.0.1-beta
CLASSIFICATION cisTEM 1.0.1
RECONSTRUCTION cisTEM 1.0.1-beta
MODEL REFINEMENT PHENIX 1.14-3260
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?