X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293.15 1 M NH4H2PO4, 100 mM Tris ( pH = 8.5 )
Unit Cell:
a: 118.859 Å b: 118.859 Å c: 118.859 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 4 3 2
Crystal Properties:
Matthew's Coefficient: 3.58 Solvent Content: 65.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4000 39.6200 21250 2108 99.9500 0.1577 0.2029 33.0799
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 50.000 99.900 0.157 ? 6.900 18.100 ? 21250 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.490 100.000 ? ? ? 18.400 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 1.4813 SSRF BL17U
Software
Software Name Purpose Version
HKL-2000 data scaling .
PHENIX refinement 1.14_3260
PDB_EXTRACT data extraction 3.25
HKL-2000 data reduction .
PHASER phasing .
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