ELECTRON MICROSCOPY

Sample

PaaZ

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details blotting force 10, blotting time 4 sec, waiting time 15 sec, drying time 0, blotting times 1.
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 101503
Reported Resolution (Å) 3.1
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol OTHER
Refinement Target ?
Overall B Value 59.9
Fitting Procedure ?
Details Real space refinement with secondary structure enabled, minimization and adp
Data Acquisition
Detector Type FEI FALCON III (4k x 4k)
Electron Dose (electrons/Å2) 27
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 2200
Maximum Defocus (nm) 3200
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 75000
Calibrated Magnification 132075
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details Data was collected with EPU software
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION Gautomatch 0.56
IMAGE ACQUISITION EPU 1.7
CTF CORRECTION Gctf 1.06
MODEL FITTING Coot 0.8
INITIAL EULER ASSIGNMENT RELION 2.0
FINAL EULER ASSIGNMENT RELION 2.0
CLASSIFICATION RELION 2.0
RECONSTRUCTION RELION 2.0
MODEL REFINEMENT PHENIX 1.13
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE CTF was corrected on each particle during refinement and reconstruction