ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	291	0.8 M Ammonium sulphate, 0.05 M MES monophydrate pH 6.5, 5 % 1,4 Dioxane 10 mM Tris pH6.8, 100 mM KCl, 3 mM DTT

Unit Cell:

a: 177.760 Å b: 177.760 Å c: 115.390 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: H 3

Crystal Properties:

Matthew's Coefficient: 2.58 Solvent Content: 52.44

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.0000	92.3300	87297	4554	99.9900	0.2245	0.2495	32.8990

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.84	92.33	100	0.209	?	7.7	9.6	?	118755	?	?	26.64

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.84	1.87	100	?	?	0.6	9.5	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SLS BEAMLINE X06SA	1	SLS	X06SA

Software