X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 293 NaOAc, PEG4000, Glycerol, Tris
Unit Cell:
a: 47.410 Å b: 47.600 Å c: 47.660 Å α: 77.070° β: 69.390° γ: 61.690°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.28 Solvent Content: 45.95
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.7000 44.5000 33932 1779 94.8300 0.1835 0.2050 24.3330
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.700 44.500 94.800 0.070 ? 6.100 2.200 ? 35712 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.700 1.730 94.200 ? ? 1.700 2.200 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.9785 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
Aimless data scaling 0.5.15
REFMAC refinement 5.8.0131
PDB_EXTRACT data extraction 3.15
iMOSFLM data reduction .
PHASER phasing .
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