X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 292.15 10 mM MES, 150 mM NaCl, 1 mM EDTA, 1 mM TCEP, 1 mM NaN3, 22% PEG3350, 0.25 M NaSCN
Unit Cell:
a: 81.122 Å b: 35.036 Å c: 81.713 Å α: 90.00° β: 93.60° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.76 Solvent Content: 55.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.600 40.481 27424 1312 99.29 0.2458 0.2968 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 40.78 99.9 0.096 ? 9.7 6.5 ? 27424 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.6 2.72 100 ? ? 2 6.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04-1 0.91587 Diamond I04-1
Software
Software Name Purpose Version
PHENIX refinement (1.12_2829)
REFMAC refinement (5.8.0189)
Aimless data scaling (0.5.32)
XDS data reduction (Jun1-2017)
BUCCANEER model building (1.6.4)
Coot model building (0.8.8)
PHASER phasing (2.8.0)