6H28

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293.15 20% w/v PEG8000
Unit Cell:
a: 39.590 Å b: 41.700 Å c: 76.760 Å α: 101.31° β: 90.02° γ: 90.05°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.11 Solvent Content: 41.68
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.19 40.89 121830 6608 83.80 0.18949 0.22377 13.077
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.19 40.89 83.8 ? ? 7.4 3.6 ? 458598 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.19 1.21 45.3 ? ? 2.1 2.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID30B 0.975 ESRF ID30B
Software
Software Name Purpose Version
REFMAC refinement 5.8.0230
XDS data reduction .
Aimless data scaling .
MOLREP phasing .