X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 293 PEG3350, AMMONIUM SULPHATE, SODIUM ACETATE.
Unit Cell:
a: 77.670 Å b: 77.670 Å c: 66.130 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 41
Crystal Properties:
Matthew's Coefficient: 2.77 Solvent Content: 55.58
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR THROUGHOUT 1.9200 20.0000 14093 754 98.4000 0.1872 0.2444 58.1600
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.920 30.751 98.600 ? 0.029 28.100 6.900 ? 14861 ? ? 39.02
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.920 1.970 97.600 ? 0.466 1.700 7.200 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04-1 0.9173 Diamond I04-1
Software
Software Name Purpose Version
XDS data reduction December 31, 2011
XSCALE data scaling December 31, 2011
SCALA data scaling 3.3.20
SHARP phasing 2.9.2BETA
REFMAC refinement 5.8.0073
Feedback Form
Name
Email
Institute
Feedback