X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 293.15 1.2 M ammonium sulphate, 100 mM citrate buffer, pH 5.0
Unit Cell:
a: 94.920 Å b: 94.920 Å c: 94.920 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 3
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 37.18
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 1.50 54.86 43498 2295 99.99 0.14481 0.17053 19.230
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.50 54.86 100 ? ? 6.6 154.7 ? 45846 ? ? 22.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.54 100 ? ? 2.3 50.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
FREE ELECTRON LASER SACLA BEAMLINE BL2 1.242 SACLA BL2
Software
Software Name Purpose Version
CrystFEL data reduction 0.6.3
REFMAC refinement 5.8.0230