X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 298 17.5 % polyethylene glycol 4,000, 250 mM (NH4)2SO4
Unit Cell:
a: 41.760 Å b: 47.970 Å c: 62.190 Å α: 97.70° β: 102.72° γ: 99.86°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.43 Solvent Content: 49.44
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.29 37.77 103379 5441 94.56 0.18762 0.20988 23.415
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.29 37.77 94.5 ? 0.041 12.56 3.6 ? 108820 ? -3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.29 1.32 89.4 ? 1.10 1.13 3.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.000033 SLS X06DA
Software
Software Name Purpose Version
REFMAC refinement 5.8.0222
XDS data reduction .
XSCALE data scaling .
SHARP phasing .
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