X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 293 40% MPD 10% PEG8000 0.1M HEPES PH 7.0
Unit Cell:
a: 31.320 Å b: 73.850 Å c: 45.340 Å α: 90.000° β: 99.310° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.5 Solvent Content: 43.8
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? ? 1.4100 38.2670 39089 1948 99.8200 0.1837 0.2052 24.4441
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.410 44.7 99.800 0.056 ? 14.760 6.69 ? 39116 ? -3.000 25.653
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.410 1.450 97.600 ? ? 1.680 6.38 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.97793 SLS X10SA
Software
Software Name Purpose Version
XDS data reduction .
PHENIX refinement .
PDB_EXTRACT data extraction 3.11
XSCALE data scaling .
CRANK2 phasing .