X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.1M MES, pH 6.5, 20% PEG2000MME
Unit Cell:
a: 59.560 Å b: 59.800 Å c: 79.090 Å α: 99.49° β: 89.56° γ: 92.61°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.01 Solvent Content: 59.09
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.88 18.95 85182 4203 97.5 0.197 0.226 31.79
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.88 47.31 97.5 ? 0.10 7.01 3.07 ? 85296 ? ? 28.60
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.88 1.97 ? ? 0.70 1.05 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.99993 SLS X10SA
Software
Software Name Purpose Version
BUSTER refinement 2.11.7
XDS data reduction .
SADABS data scaling .
PHASER phasing .