X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 25% PEG3.350, 20mM Tris-BispH5.5, 30mM NaCl, 0.2M NH4SO4
Unit Cell:
a: 57.770 Å b: 62.750 Å c: 64.340 Å α: 66.440° β: 66.550° γ: 88.050°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.54 Solvent Content: 51.60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.1000 49.1520 83934 4187 95.6700 0.1944 0.2468 43.7534
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 49.152 95.67 0.1173 ? 5.9 3.52 ? 83934 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.1 6.52 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 2 0.9725 SOLEIL PROXIMA 2
Software
Software Name Purpose Version
PHENIX refinement 1.12_2829
PDB_EXTRACT data extraction 3.24
XDS data reduction .
Coot model building .
MOLREP phasing .
APEX data scaling .