X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 200 mM Ammoniumacetate, 100 mM BisTRIS pH 5.5, 25 % PEG 3350
Unit Cell:
a: 52.595 Å b: 69.719 Å c: 70.947 Å α: 104.480° β: 101.390° γ: 111.610°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.89 Solvent Content: 57.48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.9460 48.5030 115456 5768 91.5800 0.1845 0.2165 34.6344
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.946 48.503 96.300 0.086 ? 9.820 3.428 ? 115497 ? ? 28.850
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.950 2.000 95.800 ? ? 2.100 3.545 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 1.0004 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement .
XDS data reduction .
XSCALE data scaling .
PHASER phasing 2.7.17
PDB_EXTRACT data extraction 3.24