X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 277 0.1 M sodium acetate pH 4.6, 3.5 M sodium formate, cryo protection: 20% glycero
Unit Cell:
a: 34.482 Å b: 46.749 Å c: 78.347 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.1 Solvent Content: 41.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.6130 40.1450 16898 854 99.7900 0.2347 0.2608 35.6250
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.610 40.145 99.900 0.082 ? 17.710 12.66 ? 16961 ? -3.000 29.359
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.610 1.650 98.300 ? ? 1.930 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.997100 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement 1.10.1-2155
XDS data reduction 1.11.2016
PHASER phasing 2.6.1
PDB_EXTRACT data extraction 3.11
Aimless data scaling CCP4 Package 7.0
Coot model building 0.8.8