X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.6 293 0.1 M Tris pH 7.6, 22 % PEG4000
Unit Cell:
a: 34.635 Å b: 40.941 Å c: 57.906 Å α: 84.370° β: 83.450° γ: 65.000°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.95 Solvent Content: 37.06
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.0300 31.9510 17875 882 96.7300 0.2228 0.2417 35.3813
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.030 37.050 96.800 0.154 ? 5.800 3.400 ? 18028 ? ? 23.220
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.030 2.080 96.200 ? ? ? 3.500 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9793 SLS X10SA
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.5.32
PHASER phasing .
PHENIX refinement dev_2733
PDB_EXTRACT data extraction 3.24
Coot model building 0.8.1
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