X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.3 293 0.1 M sodium citrate pH 5.3, 48 % PEG200
Unit Cell:
a: 71.472 Å b: 71.472 Å c: 87.871 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 42 2 2
Crystal Properties:
Matthew's Coefficient: 2.96 Solvent Content: 58.40
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.5350 43.9350 34716 1735 100.0000 0.1442 0.1701 31.7272
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.535 43.940 100.000 0.066 ? 24.500 15.800 ? 34745 ? ? 20.920
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.535 1.560 100.000 ? ? ? 16.300 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1 SLS X06DA
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.5.17
PHASER phasing .
PHENIX refinement 1.10.1_2155
PDB_EXTRACT data extraction 3.24
Coot model building 0.8.1
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