X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293.15 0.2 M KNO3, 20% PEG3350
Unit Cell:
a: 30.130 Å b: 41.580 Å c: 72.490 Å α: 92.01° β: 99.91° γ: 108.94°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.28 Solvent Content: 46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.31 19.44 75244 3735 95.11 0.1419 0.1745 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.31 50.00 95.1 0.044 ? 12.3 3.2 ? 75254 ? ? 13.02
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.31 1.38 92.4 ? ? 2.8 3.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.9795 SLS X06DA
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
MOSFLM data reduction CCP4 7.0.050
SCALA data scaling CCP4 7.0.050
Coot model building 0.8.9
PHASER phasing CCP4 7.0.050