X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 80mM MgCl2 , 50mM Citric acid, 4-7.5% PEG 4000, 0.025% alpha-DM, pH 4.8-5.0 or 80mM MgCl2 , 50mM Cacodylate, 4-7.5% PEG 4000, 0.025% alpha-DM, pH 5-6
Unit Cell:
a: 163.130 Å b: 213.520 Å c: 349.580 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 5.08 Solvent Content: 75.76
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 4.000 48.530 41925 842 80.91 0.3790 0.4303 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
4 49 80.89 ? ? 4 12 ? 41951 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 4 4.99 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.999 SLS X06SA
Software
Software Name Purpose Version
PHENIX refinement (dev_3042: ???)
Aimless data scaling .
MOLREP phasing .
PHASER phasing .
XSCALE data scaling .
XDS data reduction .