X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.7 295 0.1M HEPES-Na (pH 7.5), 0.2M calcium acetate, 20% PEG 3350, VAPOR DIFFUSION, Sitting drop
Unit Cell:
a: 163.824 Å b: 175.153 Å c: 131.916 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.40 Solvent Content: 48.65
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT NONE 1.386 48.484 358921 17904 94.47 0.1932 0.2123 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.386 48.484 94.7 ? ? 12.3 3.8 ? 359223 ? ? 18.1381001681
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.39 48.48 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.0 SLS X06SA
Software
Software Name Purpose Version
PHENIX refinement (1.11rc1_2513: ???)
XDS data reduction .
SCALA data scaling .
PHASER phasing .