X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291 Crystallization buffer was 0.1 M Tris-HCl (pH 8.5), 0.2 M CaCl2, 2.8% ethanol, 2.8% ethylene glycol, 2.8% 2-propanol,2.8% n-butanol, 2.8% 2-Methyl-2,4-pentanediol
Unit Cell:
a: 91.469 Å b: 91.469 Å c: 72.419 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 31 1 2
Crystal Properties:
Matthew's Coefficient: 3.11 Solvent Content: 60.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.7000 79.2140 9666 1796 99.8700 0.2171 0.2519 67.1512
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.700 79.214 99.900 0.082 0.082 29.500 20.100 9685 9685 ? ? 67.050
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.700 2.850 99.900 ? 0.879 0.900 19.500 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PETRA III, EMBL c/o DESY BEAMLINE P13 (MX1) 0.979700 PETRA III, EMBL c/o DESY P13 (MX1)
Software
Software Name Purpose Version
PHENIX refinement .
XDS data reduction .
SCALA data scaling 3.2.19
SHELXDE phasing .
PDB_EXTRACT data extraction 3.24