6FJH

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 28% PEG 3350, 200 mM ammonium acetate, 100 mM Bis Tris, pH 6.5
Unit Cell:
a: 125.300 Å b: 125.300 Å c: 154.530 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 3.07 Solvent Content: 59.88
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 3.1500 48.6600 21897 1095 99.9000 0.2000 0.2400 70.1600
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.150 48.660 99.900 0.131 ? 13.620 7.585 ? 40627 ? ? 90.380
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.150 3.200 99.300 ? ? 2.580 7.007 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 2 0.9793 SOLEIL PROXIMA 2
Software
Software Name Purpose Version
BUSTER refinement 2.10.2
XDS data reduction .
PHASER phasing 2.5.2
SHELXDE phasing .
PDB_EXTRACT data extraction 3.24
XSCALE data scaling .