X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 KDO1 : 9.3 mg/ml in 0.2 M NaCl, .001 M DTT, 0.05M Tris-HCl, pH 8 Precipitant : 18% PEG3350, 0.15 M Tris pH 7.5, 0.3 M Na Acetate Soaking/cryo : 20% PEG3350, 0.15 M Tris pH 7.5, 0.3 M Na Acetate, 20% glycerol
Unit Cell:
a: 56.650 Å b: 68.090 Å c: 110.220 Å α: 107.85° β: 102.84° γ: 93.23°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.63
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.90 38.00 117663 5883 98.6 0.178 0.203 37.56
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.90 50 98.5 ? ? 10.24 4.65 ? 117676 ? ? 29.66
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 1.95 95.6 ? ? 1.31 3.45 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.97857 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
BUSTER refinement 2.10.3
Coot model building .
XDS data reduction .
XSCALE data scaling .
Feedback Form
Name
Email
Institute
Feedback