6ERF

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 100 mM Bris Tris propane 13% PEG 3350 150 mM Na nirate
Unit Cell:
a: 98.920 Å b: 140.860 Å c: 150.310 Å α: 68.640° β: 80.850° γ: 81.230°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.26 Solvent Content: 62.23
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.0100 49.4700 90993 4537 61.9000 0.2100 0.2270 121.7500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.01 49.470 61.9 0.056 ? 11.8 3.4 ? 90993 ? ? 123.000
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.01 3.28 14.3 ? ? 1.3 3.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.97857 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
XDS data scaling .
MOLREP phasing .
BUSTER refinement 2.10.3
PDB_EXTRACT data extraction 3.22
STARANISO data scaling .
XDS data reduction .