X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 1.6 M Sodium Citrate, 0.1 M Sodium Chloride, 0.1 M Sodium Sulfate
Unit Cell:
a: 147.961 Å b: 147.961 Å c: 147.961 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 41 3 2
Crystal Properties:
Matthew's Coefficient: 2.80 Solvent Content: 56.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.1700 104.6200 13879 729 98.1400 0.2046 0.2475 63.5150
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.17 104.620 99.9 ? ? 22.5 37.4 ? 14898 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.17 2.24 98.9 ? ? 0.7 33.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97911 APS 24-ID-C
Software
Software Name Purpose Version
XDS data collection .
XSCALE data scaling .
PHASER phasing .
REFMAC refinement 5.8.0158
PDB_EXTRACT data extraction .
XDS data reduction .