X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 27% PEG 4000, 0.77 M LiCl, 0.1 M Tris pH 7.0
Unit Cell:
a: 38.300 Å b: 52.400 Å c: 68.700 Å α: 89.600° β: 88.300° γ: 81.100°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.92 Solvent Content: 35.78
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 1.9600 41.2900 36668 1841 94.2600 0.1810 0.2270 54.7056
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.960 41.290 96.700 0.066 ? 8.700 3.484 ? 36676 ? ? 38.230
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.960 2.010 84.100 ? ? 0.940 2.274 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 0.979 APS 23-ID-D
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling .
PHENIX refinement 1.13_2998
PDB_EXTRACT data extraction 3.24
SOLVE phasing .
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