6EAC

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 293 0.017 M Tris-HCl, 0.2 M calcium acetate, 0.1 M sodium chloride, 1 mM TCEP, 1 mM AMP-PNP, 22% PEG 3350, 30% ethylene glycol
Unit Cell:
a: 136.174 Å b: 158.056 Å c: 227.248 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.76 Solvent Content: 55.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.2690 49.1360 110034 1999 97.4000 0.1822 0.2117 42.0551
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2690 49.140 99.5 0.177 ? 11.5 9.1 ? 112381 ? ? 31.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.2690 2.31 93.6 ? ? 2.1 7.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97914 APS 19-ID
Software
Software Name Purpose Version
PHENIX refinement .
HKL-3000 data reduction .
HKL-3000 data scaling .
PHENIX model building .
PDB_EXTRACT data extraction 3.24
PHENIX phasing .