X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 292 0.1 M Sodium phosphate, pH 9.0, 28% polyethylene glycol 3350, 0.2 M NaCl
Unit Cell:
a: 60.464 Å b: 106.410 Å c: 82.745 Å α: 90.000° β: 96.550° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.47 Solvent Content: 50.30
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5000 65.0540 160563 8065 96.8200 0.1601 0.1670 17.0700
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 65.054 97.000 ? 0.117 9.300 3.500 160628 160628 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.500 1.580 82.200 ? 1.108 0.700 2.800 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 4.2.2 0.9762 ALS 4.2.2
Software
Software Name Purpose Version
SCALA data scaling 3.3.22
PHENIX refinement 1.8.4_1496
PDB_EXTRACT data extraction 3.24
XDS data reduction .
PHASER phasing .
Feedback Form
Name
Email
Institute
Feedback