X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 290.15 0.15M Potassium bromide, 30% (w/v) PEG 2,000 MME, plus 20% glycerol as cryoprotectant
Unit Cell:
a: 96.885 Å b: 96.885 Å c: 27.846 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 64
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.261 48.44 2482 252 99.76 0.2614 0.2855 117.01
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.26 48.44 99.8 0.125 ? 9.7 7.6 ? 2485 ? ? 109.04
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.26 3.52 99.6 ? ? 1.7 7.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 0.999954 ALS 8.2.1
Software
Software Name Purpose Version
PHENIX refinement dev_3112
XDS data reduction June 17, 2015
XDS data scaling June 17, 2015
PHASER phasing 2.5.6.