X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 291.0 26% PEG 4,000; 0.03M HEPES-KOH, pH 7.5; 0.3M Na(OAc)
Unit Cell:
a: 70.677 Å b: 111.645 Å c: 55.336 Å α: 90.000° β: 122.750° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.69
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 1.35 35.7470 77763 1561 97.7100 0.1548 0.1701 21.1363
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.350 35.750 97.800 0.043 ? 21.600 6.600 ? 77765 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.350 1.370 67.700 ? ? ? 3.100 2643
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.115820, 2.254180 ALS 8.3.1
Software
Software Name Purpose Version
PHENIX refinement 1.10.1_2155
Aimless data scaling 0.5.27
PDB_EXTRACT data extraction 3.22
XDS data reduction .
SOLVE phasing .