ISDA: 6D6Z

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.5	294.15	2 ul ~12 mg/ml LarA (100 mM Tris-HCl pH 7.5, 300 mM NaCl) mixed with 1 ul of reservoir solution. Sitting drop reservoir contained 100 ul of (NH4)2SO4 0.2M, Bis-Tris pH 5.5 0.1M, 25% w/v Polyethylene glycol 3,350. The crystal was soaked for about two minutes in (NH4)2SO4 0.15M, Bis-Tris pH 5.5 0.075M, 32% w/v Polyethylene glycol 3,350.

Unit Cell:

a: 72.764 Å b: 102.453 Å c: 133.953 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: I 2 2 2

Crystal Properties:

Matthew's Coefficient: 2.62 Solvent Content: 53.14

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.380	40.9330	19130	1951	97.9900	0.1857	0.2386	50.0573

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.380	44.410	98.300	0.125	?	12.300	9.900	?	20224	?	?	42.160

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.380	2.460	89.700	?	?	?	9.400	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-D	1.078	APS	21-ID-D

Software