X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 PEG 4000 22% (w/v), sodium acetate 100 mM, ammonium sulphate 200 mM
Unit Cell:
a: 97.446 Å b: 97.446 Å c: 193.972 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 3.40 Solvent Content: 63.82
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.6220 43.5380 15879 785 93.1500 0.2087 0.2608 72.6603
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.620 43.540 94.200 0.115 ? 9.700 5.400 ? 15940 ? ? 60.690
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.620 2.740 93.800 ? ? ? 5.300 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LNLS BEAMLINE W01B-MX2 1.458 LNLS W01B-MX2
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.5.27
PHASER phasing .
PHENIX refinement 1.10.1_2155
PDB_EXTRACT data extraction 3.24