X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 289 24% PEG2000 MME, 300 mM sodium chloride, 100 mM HEPES, pH 7.5
Unit Cell:
a: 38.308 Å b: 57.767 Å c: 65.657 Å α: 91.32° β: 89.99° γ: 90.88°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.26
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.80 19.00 47020 2534 95.01 0.16364 0.21125 28.044
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 50 97.6 0.077 ? 27.9 4.3 ? 50614 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.8 1.86 96.9 ? ? ? 4.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97937 APS 19-BM
Software
Software Name Purpose Version
REFMAC refinement 5.8.0189
HKL-2000 data reduction .
HKL-2000 data scaling .
SOLVE phasing .