6CK7

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 16.2 mg/mL LepnA.00882.a.B1.PW38390 + 2 mM actinonin against Wiz III/IV screen condition C6 (25.5% PEG4000, 0.17 M ammonium, 15% glycerol), cryoprotection: direct, crystal tracking ID 297899c6, unique puck ID iap4-1
Unit Cell:
a: 44.650 Å b: 132.060 Å c: 90.380 Å α: 90.000° β: 103.640° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.19 Solvent Content: 61.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.6500 43.3910 119355 1947 97.9500 0.1826 0.2078 33.0307
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.650 43.391 97.900 0.036 ? 15.820 3.162 ? 119433 ? ? 22.740
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.650 1.690 91.000 ? ? 2.480 2.207 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 0.97741 ALS 5.0.1
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling .
PHENIX refinement .
PDB_EXTRACT data extraction 3.24
PHASER phasing .