ISDA: 6CCK

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	291	1.3 M ammonium sulfate, 0.2 M potassium thiocyanate, 0.2 M potassium bromide

Unit Cell:

a: 135.050 Å b: 135.050 Å c: 135.050 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: I 2 3

Crystal Properties:

Matthew's Coefficient: 2.84 Solvent Content: 56.68

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	?	THROUGHOUT	1.6100	42.7100	52895	2587	100.0000	0.1770	0.1980	27.0400

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.610	42.710	100.000	0.062	?	17.400	9.500	?	53106	?	?	25.470

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.610	1.690	100.000	?	?	?	9.800	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	ALS BEAMLINE 5.0.2	1	ALS	5.0.2

Software