X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.55 293 1.35 M ammonium sulfate. 0.1 M HEPES pH 7.55, 0.1 M sodium chloride, microseeding
Unit Cell:
a: 38.289 Å b: 39.250 Å c: 73.873 Å α: 90.89° β: 93.10° γ: 90.02°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.23 Solvent Content: 45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.65 24.16 49915 2345 96.6 0.204 0.229 19.73
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 34.72 96.6 ? ? 5.3 2.0 ? 49940 ? ? 18.19
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.65 1.68 94.8 ? ? 2.1 2.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.97857 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
BUSTER refinement 2.10.2
XDS data reduction .
Aimless data scaling .
MOLREP phasing .
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