ELECTRON MICROSCOPY

Sample

Staphylococcus phage 80alpha

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument ?
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 6471
Reported Resolution (Å) 8.4
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol RIGID BODY FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type KODAK SO-163 FILM
Electron Dose (electrons/Å2) 25
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TECNAI F20
Minimum Defocus (nm) 1000
Maximum Defocus (nm) 2500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 62000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION EMAN 1.9
CTF CORRECTION EMAN 1.9
MODEL FITTING UCSF Chimera 1.10.2
MODEL REFINEMENT REFMAC 5.8.0158
MODEL REFINEMENT Coot 0.8.8
MODEL REFINEMENT Coot 0.8.6.1
INITIAL EULER ASSIGNMENT Auto3DEM 4.01
FINAL EULER ASSIGNMENT Auto3DEM 4.01
CLASSIFICATION Auto3DEM 4.01
RECONSTRUCTION Auto3DEM 4.01
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING ONLY ?