ELECTRON MICROSCOPY

Sample

Multi-component complex of Set1 with its core subunits Cps25, Cps30, Cps40, Cps50 and Cps60

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument ?
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 163539
Reported Resolution (Å) 4.3
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 9
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) ?
Maximum Defocus (nm) ?
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode OTHER
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 50000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION UCSFImage 4
CTF CORRECTION CTFFIND 4
MODEL FITTING Coot ?
FINAL EULER ASSIGNMENT RELION 1.4
CLASSIFICATION RELION 1.4
RECONSTRUCTION RELION 1.4
MODEL REFINEMENT PHENIX dev-2880
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?