X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.80 293 28% PEG4000, 0.2M SODIUM ACETATE, 0.1M TRIS-HCL, PH 8.8, SITTING DROP, TEMPERATURE 293K
Unit Cell:
a: 49.370 Å b: 49.720 Å c: 70.970 Å α: 89.990° β: 77.700° γ: 89.870°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.10 Solvent Content: 41.51
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.6500 29.2640 73526 1989 92.6900 0.1986 0.2438 22.5096
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.650 50 92.700 0.049 ? 10.090 2.0 ? 73559 ? ? 16.050
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.650 1.690 93.400 ? ? 2.500 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.000 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.9787 APS 21-ID-F
Software
Software Name Purpose Version
PHENIX refinement DEV_1883
PDB_EXTRACT data extraction 3.24
XDS data reduction .
XSCALE data scaling .
MOLREP phasing .