X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 50mM MES, pH5.8, 50mM KH2PO4, 27.7% PEG 300, 25mM DTT, 1.25% 2,5-Hexanediol after 3.5 months.
Unit Cell:
a: 99.541 Å b: 99.541 Å c: 158.386 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 63
Crystal Properties:
Matthew's Coefficient: 3.27 Solvent Content: 62.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.2500 86.2050 39928 1998 94.8100 0.2580 0.2779 87.2261
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.250 86.210 99.400 0.080 ? 12.300 5.200 ? 41855 ? ? 62.660
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.250 2.320 99.700 ? ? ? 5.200 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.979100 APS 24-ID-C
Software
Software Name Purpose Version
Aimless data scaling 0.5.23
PHASER phasing 2.7.15
PHENIX refinement 1.12_2829
PDB_EXTRACT data extraction 3.22
XDS data reduction .
PHENIX model building .