X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.1M HEPES, pH 7.03, 50mM KH2PO4, 31% PEG 300, 50mM DTT, and 2.5% 2,5-hexanediol
Unit Cell:
a: 99.794 Å b: 99.794 Å c: 159.947 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 63
Crystal Properties:
Matthew's Coefficient: 3.33 Solvent Content: 63.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.950 28.808 18958 1884 99.75 0.2366 0.2453 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.950 28.810 99.900 0.154 ? 13.600 15.700 ? 19027 ? ? 118.880
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.950 3.130 99.800 ? ? ? 15.700 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 1.27951 APS 23-ID-D
Software
Software Name Purpose Version
PHENIX refinement 1.12_2829
Aimless data scaling 0.5.29
PHASER phasing 2.7.16
PDB_EXTRACT data extraction 3.22
Blu-Ice data collection .
XDS data reduction .
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