X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 24-26% PEG 3350, 100mM Bis-Tris, 200mM ammonium sulfate
Unit Cell:
a: 51.346 Å b: 60.525 Å c: 63.618 Å α: 91.83° β: 92.97° γ: 90.01°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.65 Solvent Content: 53.54
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.995 34.212 50522 2500 97.14 0.1982 0.2338 24.0
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.995 34.212 97.4 ? 0.10 11.0 2.5 ? 50558 ? ? 22.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.995 2.03 90.7 ? 0.40 1.8 1.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9794 APS 19-ID
Software
Software Name Purpose Version
PHENIX refinement 1.8_1069
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing .